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June 13, 2008

Patents at Mach 2: Technology on the Cutting Edge. Workshop at the ASEE 2008 Conference

Patents at Mach 2: Technology on the Cutting Edge Workshop at the 2008 ASEE Annual conference

Abstract:

In 2007, the U.S. Patent and Trademark Office received a record-breaking 450,000 new patent applications. Worldwide patent filings are on the rise, with innovations in information and computer technology, biotechnology and nanotechnology driving much of the increase. This hands-on workshop will introduce you to advanced techniques and tools for searching patents using case studies from biomedical engineering, biotechnology, electrical and mechanical engineering. You will learn how to use the U.S. and International patent classification systems to improve your search results and explore new online tools for keeping up to date with emerging technologies.

Jay’s presentation

Patents at Mach 2: Drexel Experience in a Biomedical Engineering class

For more information, handouts and further reading, please refer to:
Patents at Mach 2.0: Technology on the Cutting Edge

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Filed under: Patent Searching — bhattjj @ 8:13 pm


June 4, 2008

What is INSPEC? How do I access it?

INSPEC Database (coverage now available from 1896) contains nearly 10 million bibliographic abstracts and indexing to journal articles, conference proceedings, technical reports and other literature from publications in the fields of physics, electrical and electronic engineering, communications, computer science, control engineering, information technology, manufacturing and mechanical engineering, operations research, material science, oceanography, engineering mathematics, nuclear engineering, environmental science, geophysics, nanotechnology, biomedical technology and biophysics. It is updated weekly.

INSPEC is available from Engineering Village where both Ei Compendex, a leading Engineering database, and INSPEC can be searched at the same time.

You can also access INSPEC from Engineering Databases . Click on Engineering Village or INSPEC.

Under ‘Select Databases’ mark ‘Compendex’ and ‘INSPEC’ to search both at the same time.

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Filed under: Electronic Databases Search Tips — bhattjj @ 11:48 am


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